@article{BaumbachLuebbertPietschetal.1998,
  author    = {Baumbach, Tilo and L{\"u}bbert, Daniel and Pietsch, Uwe and Darowski, Nora and Leprince, L. and Talneau, A. and Schneck, J.},
  title     = {Grazing incidence diffraction by epitaxial multilayered gratings},
  year      = {1998},
  language  = {en}
}
@article{DarowskiPaschkePietschetal.1997,
  author    = {Darowski, Nora and Paschke, K. and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and Baumbach, Tilo and Zeimer, Ute},
  title     = {Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction},
  year      = {1997},
  language  = {en}
}
@article{DarowskiPaschkePietschetal.1998,
  author    = {Darowski, Nora and Paschke, K. and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and L{\"u}bbert, Daniel and Baumbach, Tilo},
  title     = {Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction},
  year      = {1998},
  language  = {en}
}
@article{LuebbertBaumbachPontietal.1999,
  author    = {L{\"u}bbert, Daniel and Baumbach, Tilo and Ponti, S. and Pietsch, Ullrich and Leprince, L. and Schneck, J. and Talneau, A.},
  title     = {Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity},
  year      = {1999},
  language  = {en}
}
@article{UlyanenkovBaumbachDarowskietal.1999,
  author    = {Ulyanenkov, A. and Baumbach, Tilo and Darowski, Nora and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and Wiebach, T.},
  title     = {Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]},
  year      = {1999},
  language  = {en}
}
@article{ZeimerBaumbachGrenzeretal.1999,
  author    = {Zeimer, Ute and Baumbach, Tilo and Grenzer, J{\"o}rg and L{\"u}bbert, Daniel and Mazuelas, A. and Pietsch, Ullrich and Erbert, G.},
  title     = {In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation},
  year      = {1999},
  language  = {en}
}