@article{DietrichGlamschEhlertetal.2016,
  author    = {Dietrich, Paul M. and Glamsch, Stephan and Ehlert, Christopher and Lippitz, Andreas and Kulak, Nora and Unger, Wolfgang E. S.},
  title     = {Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon},
  series = {Applied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces},
  volume    = {363},
  journal   = {Applied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces},
  publisher = {Elsevier},
  address   = {Amsterdam},
  issn      = {0169-4332},
  doi       = {10.1016/j.apsusc.2015.12.052},
  pages     = {406 -- 411},
  year      = {2016},
  abstract  = {The analysis of chemical and elemental in-depth variations in ultra-thin organic layers with thicknesses below 5 nm is very challenging. Energy- and angle-resolved XPS (ER/AR-XPS) opens up the possibility for non-destructive chemical ultra-shallow depth profiling of the outermost surface layer of ultra-thin organic films due to its exceptional surface sensitivity. For common organic materials a reliable chemical in-depth analysis with a lower limit of the XPS information depth z(95) of about 1 nm can be performed. As a proof-of-principle example with relevance for industrial applications the ER/AR-XPS analysis of different organic monolayers made of amino- or benzamidosilane molecules on silicon oxide surfaces is presented. It is demonstrated how to use the Si 2p core-level region to non-destructively depth-profile the organic (silane monolayer) - inorganic (SiO2/Si) interface and how to quantify Si species, ranging from elemental silicon over native silicon oxide to the silane itself. The main advantage of the applied ER/AR-XPS method is the improved specification of organic from inorganic silicon components in Si 2p core-level spectra with exceptional low uncertainties compared to conventional laboratory XPS. (C) 2015 Elsevier B.V. All rights reserved.},
  language  = {en}
}
@article{SchmidtElizarovRiemeretal.2015,
  author    = {Schmidt, Bernd and Elizarov, Nelli and Riemer, Nastja and H{\"o}lter, Frank},
  title     = {Acetamidoarenediazonium Salts: Opportunities for Multiple Arene Functionalization},
  series = {European journal of organic chemistry},
  journal   = {European journal of organic chemistry},
  number    = {26},
  publisher = {Wiley-VCH},
  address   = {Weinheim},
  issn      = {1434-193X},
  doi       = {10.1002/ejoc.201500795},
  pages     = {5826 -- 5841},
  year      = {2015},
  abstract  = {Unlike their ortho counterparts, meta- and para-acetamidoanilines can be converted into the corresponding acetamidoarenediazonium salts. These offer various opportunities for multiple Pd-catalyzed arene functionalization reactions, such as Matsuda-Heck-, Suzuki-Miyaura- or Fujiwara-Moritani couplings.},
  language  = {en}
}