@misc{MuehlbauerSchroederSkoncejetal.2017,
  author    = {M{\"u}hlbauer, Felix and Schr{\"o}der, Lukas and Skoncej, Patryk and Sch{\"o}lzel, Mario},
  title     = {Handling manufacturing and aging faults with software-based techniques in tiny embedded systems},
  series = {18th IEEE Latin American Test Symposium (LATS 2017)},
  journal   = {18th IEEE Latin American Test Symposium (LATS 2017)},
  publisher = {IEEE},
  address   = {New York},
  isbn      = {978-1-5386-0415-1},
  doi       = {10.1109/LATW.2017.7906756},
  pages     = {6},
  year      = {2017},
  abstract  = {Non-volatile memory area occupies a large portion of the area of a chip in an embedded system. Such memories are prone to manufacturing faults, retention faults, and aging faults. The paper presents a single software based technique that allows for handling all of these fault types in tiny embedded systems without the need for hardware support. This is beneficial for low-cost embedded systems with simple memory architectures. A software infrastructure and a flow are presented that demonstrate how the presented technique is used in general for fault handling right after manufacturing and in-the-field. Moreover, a full implementation is presented for a MSP430 microcontroller, along with a discussion of the performance, overhead, and reliability impacts.},
  language  = {en}
}