@article{ZinkWernerJechowetal.2014,
  author    = {Zink, Christof and Werner, Nils and Jechow, Andreas and Heuer, Axel and Menzel, Ralf},
  title     = {Multi-wavelength operation of a single broad area diode laser by spectral beam combining},
  series = {IEEE photonics technology letters},
  volume    = {26},
  journal   = {IEEE photonics technology letters},
  number    = {3},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {1041-1135},
  doi       = {10.1109/LPT.2013.2291963},
  pages     = {253 -- 256},
  year      = {2014},
  abstract  = {Stabilized multi-wavelength emission from a single emitter broad area diode laser (BAL) is realized by utilizing an external cavity with a spectral beam combining architecture. Self-organized emitters that are equidistantly spaced across the slow axis are enforced by the spatially distributed wavelength selectivity of the external cavity. This resulted in an array like near-field emission although the BAL is physically a single emitter without any epitaxial sub-structuring and only one electrical contact. Each of the self-organized emitters is operated at a different wavelength and the emission is multiplexed into one spatial mode with near-diffraction limited beam quality. With this setup, multi-line emission of 31 individual spectral lines centered around and a total spectral width of 3.6 nm is realized with a 1000 mu m wide BAL just above threshold. To the best of our knowledge, this is the first demonstration of such a self-organization of emitters by optical feedback utilizing a spectral beam combining architecture.},
  language  = {en}
}
@article{SumpfMaiwaldMulleretal.2012,
  author    = {Sumpf, Bernd and Maiwald, Martin and Muller, Andre and Ginolas, Arnim and Haeusler, Karl and Erbert, Goetz and Traenkle, Guenther},
  title     = {Reliable operation for 14 500 h of a wavelength-stabilized Diode Laser System on a Microoptical Bench at 671 nm},
  series = {IEEE transactions on components, packaging and manufacturing technology},
  volume    = {2},
  journal   = {IEEE transactions on components, packaging and manufacturing technology},
  number    = {1},
  publisher = {Inst. of Electr. and Electronics Engineers},
  address   = {Piscataway},
  issn      = {2156-3950},
  doi       = {10.1109/TCPMT.2011.2171342},
  pages     = {116 -- 121},
  year      = {2012},
  abstract  = {Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.},
  language  = {en}
}