@article{KrollKernKubinetal.2016, author = {Kroll, Thomas and Kern, Jan and Kubin, Markus and Ratner, Daniel and Gul, Sheraz and Fuller, Franklin D. and L{\"o}chel, Heike and Krzywinski, Jacek and Lutman, Alberto and Ding, Yuantao and Dakovski, Georgi L. and Moeller, Stefan and Turner, Joshua J. and Alonso-Mori, Roberto and Nordlund, Dennis L. and Rehanek, Jens and Weniger, Christian and Firsov, Alexander and Brzhezinskaya, Maria and Chatterjee, Ruchira and Lassalle-Kaiser, Benedikt and Sierra, Raymond G. and Laksmono, Hartawan and Hill, Ethan and Borovik, Andrew S. and Erko, Alexei and F{\"o}hlisch, Alexander and Mitzner, Rolf and Yachandra, Vittal K. and Yano, Junko and Wernet, Philippe and Bergmann, Uwe}, title = {X-ray absorption spectroscopy using a self-seeded soft X-ray free-electron laser}, series = {Optics express : the international electronic journal of optics}, volume = {24}, journal = {Optics express : the international electronic journal of optics}, publisher = {Optical Society of America}, address = {Washington}, issn = {1094-4087}, doi = {10.1364/OE.24.022469}, pages = {22469 -- 22480}, year = {2016}, abstract = {X-ray free electron lasers (XFELs) enable unprecedented new ways to study the electronic structure and dynamics of transition metal systems. L-edge absorption spectroscopy is a powerful technique for such studies and the feasibility of this method at XFELs for solutions and solids has been demonstrated. However, the required x-ray bandwidth is an order of magnitude narrower than that of self-amplified spontaneous emission (SASE), and additional monochromatization is needed. Here we compare L-edge x-ray absorption spectroscopy (XAS) of a prototypical transition metal system based on monochromatizing the SASE radiation of the linac coherent light source (LCLS) with a new technique based on self-seeding of LCLS. We demonstrate how L-edge XAS can be performed using the self-seeding scheme without the need of an additional beam line monochromator. We show how the spectral shape and pulse energy depend on the undulator setup and how this affects the x-ray spectroscopy measurements. (C) 2016 Optical Society of America}, language = {en} }