@article{SchickHerzogBojahretal.2014,
  author    = {Schick, Daniel and Herzog, Marc and Bojahr, Andre and Leitenberger, Wolfram and Hertwig, Andreas and Shayduk, Roman and Bargheer, Matias},
  title     = {Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction},
  series = {Structural dynamics},
  volume    = {1},
  journal   = {Structural dynamics},
  number    = {6},
  publisher = {American Institute of Physics},
  address   = {Melville},
  issn      = {2329-7778},
  doi       = {10.1063/1.4901228},
  pages     = {13},
  year      = {2014},
  abstract  = {Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.},
  language  = {en}
}