@misc{KrstićJentzsch2018,
  author    = {Krstić, Miloš and Jentzsch, Anne-Kristin},
  title     = {Reliability, safety and security of the electronics in automated driving vehicles - joint lab lecturing approach},
  series = {2018 12TH European Workshop on Microelectronics Education (EWME)},
  journal   = {2018 12TH European Workshop on Microelectronics Education (EWME)},
  publisher = {IEEE},
  address   = {New York},
  isbn      = {978-1-5386-1157-9},
  pages     = {21 -- 22},
  year      = {2018},
  abstract  = {This paper proposes an education approach for master and bachelor students to enhance their skills in the area of reliability, safety and security of the electronic components in automated driving. The approach is based on the active synergetic work of research institutes, academia and industry in the frame of joint lab. As an example, the jointly organized summer school with the respective focus is organized and elaborated.},
  language  = {en}
}
@article{ChenLangeAndjelkovicetal.2022,
  author    = {Chen, Junchao and Lange, Thomas and Andjelkovic, Marko and Simevski, Aleksandar and Lu, Li and Krstic, Milos},
  title     = {Solar particle event and single event upset prediction from SRAM-based monitor and supervised machine learning},
  series = {IEEE transactions on emerging topics in computing / IEEE Computer Society, Institute of Electrical and Electronics Engineers},
  volume    = {10},
  journal   = {IEEE transactions on emerging topics in computing / IEEE Computer Society, Institute of Electrical and Electronics Engineers},
  number    = {2},
  publisher = {Institute of Electrical and Electronics Engineers},
  address   = {[New York, NY]},
  issn      = {2168-6750},
  doi       = {10.1109/TETC.2022.3147376},
  pages     = {564 -- 580},
  year      = {2022},
  abstract  = {The intensity of cosmic radiation may differ over five orders of magnitude within a few hours or days during the Solar Particle Events (SPEs), thus increasing for several orders of magnitude the probability of Single Event Upsets (SEUs) in space-borne electronic systems. Therefore, it is vital to enable the early detection of the SEU rate changes in order to ensure timely activation of dynamic radiation hardening measures. In this paper, an embedded approach for the prediction of SPEs and SRAM SEU rate is presented. The proposed solution combines the real-time SRAM-based SEU monitor, the offline-trained machine learning model and online learning algorithm for the prediction. With respect to the state-of-the-art, our solution brings the following benefits: (1) Use of existing on-chip data storage SRAM as a particle detector, thus minimizing the hardware and power overhead, (2) Prediction of SRAM SEU rate one hour in advance, with the fine-grained hourly tracking of SEU variations during SPEs as well as under normal conditions, (3) Online optimization of the prediction model for enhancing the prediction accuracy during run-time, (4) Negligible cost of hardware accelerator design for the implementation of selected machine learning model and online learning algorithm. The proposed design is intended for a highly dependable and self-adaptive multiprocessing system employed in space applications, allowing to trigger the radiation mitigation mechanisms before the onset of high radiation levels.},
  language  = {en}
}