@article{DarowskiPietschWangetal.1998,
  author    = {Darowski, Nora and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and Shen, W. and Kycia, S.},
  title     = {X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures},
  year      = {1998},
  language  = {en}
}
@article{HaierHerrmannEsseretal.1998,
  author    = {Haier, P. and Herrmann, B. A. and Esser, N. and Pietsch, Ullrich and L{\"u}ders, K. and Richter, W.},
  title     = {Influence of the deposition rate on the structure of thin metal layers},
  year      = {1998},
  language  = {en}
}
@article{StahnPucherGeueetal.1998,
  author    = {Stahn, Jochen and Pucher, Andreas and Geue, Thomas and Daniel, A. and Pietsch, Ullrich},
  title     = {Electric field induced electron density response of GaAs and ZnSe},
  year      = {1998},
  language  = {en}
}
@article{DarowskiLuebbertPietschetal.1998,
  author    = {Darowski, Nora and L{\"u}bbert, Daniel and Pietsch, Ullrich and Zhuang, Y. and Zerlauth, S. and Bauer, G{\"u}nther},
  title     = {In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays},
  year      = {1998},
  language  = {en}
}
@article{StoemmerGoebelHubetal.1998,
  author    = {St{\"o}mmer, Ralph and G{\"o}bel, H. and Hub, W. and Pietsch, Ullrich},
  title     = {X-ray scattering from silicon surfaces},
  year      = {1998},
  language  = {en}
}
@article{StoemmerMartinGeueetal.1998,
  author    = {St{\"o}mmer, Ralph and Martin, C. R. and Geue, Thomas and G{\"o}bel, H. and Hub, W. and Pietsch, Ullrich},
  title     = {Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy},
  year      = {1998},
  language  = {en}
}
@article{DarowskiPietschZeimeretal.1998,
  author    = {Darowski, Nora and Pietsch, Ullrich and Zeimer, Ute and Smirnitzki, V. and Bugge, F.},
  title     = {Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction},
  year      = {1998},
  language  = {en}
}
@article{DarowskiPaschkePietschetal.1998,
  author    = {Darowski, Nora and Paschke, K. and Pietsch, Ullrich and Wang, K. H. and Forchel, Alfred and L{\"u}bbert, Daniel and Baumbach, Tilo},
  title     = {Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction},
  year      = {1998},
  language  = {en}
}
@article{UlyanenkovKlemradtPietsch1998,
  author    = {Ulyanenkov, A. and Klemradt, U. and Pietsch, Ullrich},
  title     = {Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering},
  year      = {1998},
  language  = {en}
}
@article{GrenzerSchomburgLingottetal.1998,
  author    = {Grenzer, J{\"o}rg and Schomburg, E. and Lingott, I. and Ignotov, A. a. and Renk, K. F. and Pietsch, Ullrich and Rose, Dirk and Zeimer, Ute and Melzer, B. J. and Ivanov, S. and Schaposchnikov, S. and Kop'ev, P. S. and Pavel'ev, D. G. and Koschurinov, Yu.},
  title     = {X-ray and transport characterization of an Esaki-Tsu superlattice device},
  year      = {1998},
  language  = {en}
}