@article{HennebergPanznerPietschetal.2004,
  author    = {Henneberg, Oliver and Panzner, Tobias and Pietsch, Ullrich and Geue, Thomas and Saphiannikova, Marina and Rochon, Paul and Finkelstein, Kenneth D.},
  title     = {X-ray and VIS light scattering from light-induced polymer gratings},
  issn      = {0044-2968},
  year      = {2004},
  abstract  = {Sinusoidally shaped surface relief gratings made of polymer films containing, azobenzene moieties can be created by holographic illumination with laser light of about lambda approximate to 500 nm. The remarkable material transport takes place at temperatures far (100 K) below the glass transition temperature of the material. As probed by visible light scattering the efficiency of grating formation crucially depends on the polarization state of the laser light and is maximal when circular polarization is used. In contrast to VIS light scattering X-ray diffraction is most sensitive for periodic surface undulations with amplitudes below 10 nm. Thus, combined in-situ X-ray and visible light scattering at CHESS were used to investigate the dynamics of surface relief grating formations upon laser illumination. The time development of grating peaks up to 9th order at laser power of P = 20 mW/cm(2) could be investigated, even the onset of grating formation as a function of light polarization. A linear growth of grating amplitude was observed for all polarizations. The growth velocity is maximal using circularly polarized light but very small for s-polarized light},
  language  = {en}
}
@article{HennebergPietschPanzneretal.2006,
  author    = {Henneberg, Oliver and Pietsch, Ullrich and Panzner, Tobias and Geue, Thomas and Finkelstein, Kenneth D.},
  title     = {Simultaneous X-ray and visible light diffraction for the investigation of surface relief and density grating formation in azobenzene containing polymer films},
  issn      = {1542-1406},
  doi       = {10.1080/15421400500383345},
  year      = {2006},
  abstract  = {The development of surface relief and density patterns in azobenzene polymer films was studied by diffraction at two different wavelengths. We used x-ray diffraction of synchrotron radiation at 0.124 nm in combination with visible light diffraction at a wavelength of 633 nm. In contrast to visible light scattering x-ray diffraction allows the separation of a surface relief and a density grating contribution due to the different functional dependence of the scattering power. Additionally, the x-ray probe is most sensitive for the onset of the surface grating formation},
  language  = {en}
}
@article{HennebergRochonPanzneretal.2004,
  author    = {Henneberg, Oliver and Rochon, Paul and Panzner, Tobias and Finkelstein, Kenneth D. and Geue, Thomas and Saphiannikova, Marina and Pietsch, Ullrich},
  title     = {In-situ Investigation of Surface Relief Grating Formation in Photosensitive Polymers},
  year      = {2004},
  language  = {en}
}
@article{JoshiPingelGrigorianetal.2009,
  author    = {Joshi, Siddharth and Pingel, Patrick and Grigorian, Souren and Panzner, Tobias and Pietsch, Ullrich and Neher, Dieter and Forster, Michael and Scherf, Ullrich},
  title     = {Bimodal temperature behavior of structure and mobility in high molecular weight p3ht thin films},
  issn      = {0024-9297},
  doi       = {10.1021/Ma900021w},
  year      = {2009},
  abstract  = {We report a temperature dependent crystalline structure of spin-coated thin films of high molecular weight regioregular poly(3-hexylthiophene) (P3HT) (M-n similar to 30000 g/mol) and its correlation with charge carrier mobility. These investigations show a reversible change of the crystalline structure, where the interlayer lattice spacing (100)along the alkyl side chains continuously increases up to a temperature of about 220 degrees C; in contrast, the in-plane pi-pi distance reduces with increasing temperature. These changes in structure are reversible and can be repeated several times. The temperature-induced structural properties differ for thick and thin films, pointing to a surface/interface role in stabilization of the layer morphology. In contrast to the structural changes, the carrier mobility is rather constant in the temperature range from room temperature up to 100-120 degrees C, followed by a continuous decrease. For thick layers this drop is significant and the transistor performance almost vanishes at high temperature, however, it completely recovers upon cooling back to roorn temperature. The drop of the charge carrier mobility at higher temperatures is in contrast with expectations front the structural studies, considering the increase of crystalline fraction of the polycrystalline layer. our electrical measurements Underscore that the reduction of the macroscopic mobility is mostly caused by it pronounced decrease of the intergrain transport. The thermally induced crystallization along(100) direction and the creation of numerous small crystallites at the film-substrate interface reduce the number of long polymer chain, bridging crystalline domains, which ultimately limits the macroscopic charge transport.},
  language  = {en}
}
@article{PanznerGleberSantetal.2007,
  author    = {Panzner, Tobias and Gleber, Gudrun and Sant, Tushar and Leitenberger, Wolfram and Pietsch, Ullrich},
  title     = {Coherence experiments at the white-beam beamline of BESSYI},
  doi       = {10.1016/j.tsf.2006.12.002},
  year      = {2007},
  abstract  = {The third-generation X-ray source BESSYII (Berlin, Germany) provides coherent X-ray radiation which can be used for static and dynamic speckle analysis. Recently we have demonstrated that one can perform experiments with coherent white radiation provided by a bending magnet (5 < E < 20 keV). In this paper we show that the diffraction figure of the initial pinhole must be considered for the interpretation of coherent experiments. The reflectivity spectrum of a sample results from the Fresnel diffraction of the incident pinhole deformed by the static speckle features of the sample surface. For dynamical experiments all speckle like features alter with time whereas the pure Fresnel fringes remain constant. (c) 2007 Published by Elsevier B.V.},
  language  = {en}
}
@article{PietschJarreSaldittetal.2004,
  author    = {Pietsch, Ullrich and Jarre, A. and Salditt, T. and Panzner, Tobias and Pfeiffer, F.},
  title     = {White beam x-ray waveguide optics},
  year      = {2004},
  abstract  = {We report a white beam x-ray waveguide (WG) experiment. A resonant beam coupler x-ray waveguide (RBC) is used simultaneously as a broad bandpass (or multibandpass) monochromator and as a beam compressor. We show that, depending on the geometrical properties of the WG, the exiting beam consists of a defined number of wavelengths which can be shifted by changing the angle of incidence of the white x-ray synchrotron beam. The characteristic far-field pattern is recorded as a function of exit angle and energy. This x-ray optical setup may be used to enhance the intensity of coherent x-ray WG beams since the full energetic acceptance of the WG mode is transmitted. (C) 2004 American Institute of Physics},
  language  = {en}
}
@article{PietschLeitenbergerWendrocketal.2003,
  author    = {Pietsch, Ullrich and Leitenberger, Wolfram and Wendrock, Horst and Bischoff, Lothar and Panzner, Tobias and Grenzer, J{\"o}rg and Pucher, Andreas},
  title     = {Double pinhole diffraction of white synchrotron radiation},
  year      = {2003},
  language  = {en}
}
@article{PietschPanznerLeitenbergeretal.2003,
  author    = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Grenzer, J{\"o}rg and Bodenthin, Th. and Geue, Thomas and M{\"o}hwald, Helmuth},
  title     = {Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II},
  year      = {2003},
  language  = {en}
}
@article{PietschPanznerLeitenbergeretal.2005,
  author    = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Vartanyants, Ivan A.},
  title     = {Coherence experiments using white synchrotron radiation},
  year      = {2005},
  abstract  = {Experiments at the bending magnet beamline at BESSY II (EDR beamline) profit from the excellent coherence properties of third generation synchrotron sources. Considering the exponentially decaying incident spectrum, and because no optical elements are installed except slits and vacuum windows, coherence experiments can be performed between 5 keV < E < 15 keV. First, the energy dependence of spatial coherence properties were determined measuring diffraction at single and double pinholes. Next, the coherent white radiation was used to probe the morphology of thin films in reflection geometry. The recorded intensity maps (reflectivity versus sample position) provide speckle patterns which reveal the locally varying sample morphology. Setting the incident angle, alpha(i), smaller or larger than the critical angle of total external reflection, alpha(c), one should be able to separate the surface height profile from the subsurface density modulation of a sample. The validity of this approach is verified at the example of reciprocal space maps taken from a polymer surface where we could reconstruct the lateral height profile from speckle data. (C) 2004 Elsevier B.V. All rights reserved},
  language  = {en}
}
@article{PietschPanznerLeitenbergeretal.2005,
  author    = {Pietsch, Ullrich and Panzner, Tobias and Leitenberger, Wolfram and Vartanyants, Ivan A.},
  title     = {Coherence experiments at the EDR-beamline of BESSY II},
  year      = {2005},
  language  = {en}
}