@article{LiChenNofaletal.2018,
  author    = {Yuanqing Li and Li Chen and Issam Nofal and Mo Chen and Haibin Wang and Rui Liu and Qingyu Chen and Miloš Krstić and Shuting Shi and Gang Guo and Sang H. Baeg and Shi-Jie Wen and Richard Wong},
  title     = {Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree},
  journal   = {Microelectronics reliability},
  volume    = {87},
  pages     = {24 -- 32},
  doi       = {10.1016/j.microrel.2018.05.016},
  year      = {2018},
}