TY  - JOUR
A1  - Rabenalt, Thomas
A1  - Goessel, Michael
A1  - Leininger, Andreas
T1  - Masking of X-Values by use of a hierarchically configurable register
T2  - Journal of electronic testing : theory and applications
N2  - In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.
KW  - Masking of X-values
KW  - Hierarchically configurable mask register
Y1  - 2011
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/37028
SN  - 0923-8174
VL  - 27
IS  - 1
SP  - 31
EP  - 41
PB  - Springer
CY  - Dordrecht
ER  -