TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A multi-mode scannable memory element for high test application efficiency and delay testing
Y1  - 1998
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/23396
ER  -