TY  - JOUR
A1  - Singh, Adit D.
A1  - Sogomonyan, Egor S.
A1  - Gössel, Michael
A1  - Seuring, Markus
T1  - Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Y1  - 1999
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/21834
ER  -