TY  - JOUR
A1  - Sogomonyan, Egor S.
A1  - Singh, Adit D.
A1  - Gössel, Michael
T1  - A scan based concrrent BIST approach for low cost on-line testing
Y1  - 1998
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/23411
ER  -