TY  - JOUR
A1  - Schick, Daniel
A1  - Herzog, Marc
A1  - Bojahr, Andre
A1  - Leitenberger, Wolfram
A1  - Hertwig, Andreas
A1  - Shayduk, Roman
A1  - Bargheer, Matias
T1  - Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction
T2  - Structural dynamics
N2  - Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
Y1  - 2014
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/37409
SN  - 2329-7778
VL  - 1
IS  - 6
PB  - American Institute of Physics
CY  - Melville
ER  -