TY  - JOUR
A1  - Reiche, Jürgen
A1  - Pietsch, Ullrich
A1  - Fink, Hans-Peter
A1  - Lemmetyinen, Helge
T1  - A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers
N2  - The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.
Y1  - 1992
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/29243
ER  -