TY  - JOUR
A1  - Paschke, K.
A1  - Geue, Thomas
A1  - Barberka, Thomas Andreas
A1  - Bolm, A.
A1  - Pietsch, Ullrich
A1  - Rösch, M.
A1  - Batke, Edwin
A1  - Faller, F.
A1  - Kerkel, K.
A1  - Oshiniwo, J.
A1  - Forchel, Alfred
T1  - Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
Y1  - 1997
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/24526
ER  -