TY  - JOUR
A1  - Metzger, T. H.
A1  - Pietsch, Ullrich
A1  - Garstein, E.
T1  - High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
Y1  - 1999
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/21484
ER  -