TY  - JOUR
A1  - Pham, Cong Duc
A1  - Petre, Anca
A1  - Berquez, Laurent
A1  - Flores Suárez, Rosaura
A1  - Mellinger, Axel
A1  - Wirges, Werner
A1  - Gerhard, Reimund
T1  - 3D high-resolution mapping of polarization profiles in thin poly(vinylidenefluoride-trifluoroethylene) (PVDF- TrFE) films using two thermal techniques
N2  - In this paper, two non-destructive thermal methods are used in order to determine, with a high degree of accuracy, three-dimensional polarization distributions in thin films (12 mu m) of poly(vinylidenefluoride- trifluoroethylene) (PVDF-TrFE). The techniques are the frequency-domain Focused Laser Intensity Modulation Method (FLIMM) and time-domain Thermal-Pulse Tomography (TPT). Samples were first metalized with grid-shaped electrode and poled. 3D polarization mapping yielded profiles which reproduce the electrode-grid shape. The polarization is not uniform across the sample thickness. Significant polarization values are found only at depths beyond 0.5 mu m from the sample surface. Both methods provide similar results, TPT method being faster, whereas the FLIMM technique has a better lateral resolution.
Y1  - 2009
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/31849
UR  - http://ieeexplore.ieee.org/servlet/opac?punumber=94
SN  - 1070-9878
ER  -